|
Brian P. Wilfley, Ph.D
Dr. Wilfley has over 20 years of experience in leading development efforts for medical device and optical instrumentation concerns. His expertise includes a demonstrated ability to measure, analyze and exploit the performance of complex systems; and develop algorithms for data analysis, system control, and image processing. He has developed image processing pipeline tools to process tens of thousands of x-ray images, a scripting tool-set to drive image reconstruction, and a simulated-annealing technique for optimizing pixel positions in x-ray detectors. He has constructed models and code to implement the Automatic Exposure Control system for a scanning beam digital x-ray system and a rule-based method of assigning imaging parameters to clinical situations. He designed a standard experimental and analysis methodology for testing x-ray targets, and tools to drive simulation of microwave cavities used to measure protein-ligand binding. He has also developed techniques for measuring numerous system performance parameters including spatial resolution, noise-power, quantum-efficiency, electron-beam spot shape and alignment, x-ray beam quality, x-ray leakage, and magnetic shielding. Dr. Wilfley is a co-inventor of six issued patents and has authored a number of technical papers. He received his AB in Physics from the University of California at Berkeley and his Ph.D. in Physics from the University of California at San Diego.
|
|
H. Keith Nishihara, Ph.D.
Dr. Nishihara is an authority in the fields of medical image processing, computer vision, robotic navigation, real-time vision system design, and industrial inspection. He is a principal of Lu and Nishihara Associates which provides consulting services to major corporations. Previously Dr. Nishihara was the V.P. of Research and Development at PhorMax Corporation and has held senior technical and management positions at MIT's Artificial Intelligence Laboratory, Schlumberger's Palo Alto Research Laboratory, Teleos Research, Autodesk, Stanford University and NASA's Ames Research Center. Dr. Nishihara received his Ph.D. from the Massachusetts Institute of Technology. He has published widely and holds patents related to medical imaging devices, industrial inspection, real-time processor design, and pattern recognition. Dr. Nishihara's academic research has been highlighted in cover articles in Nature magazine and Technology Review. |
|
